Prof. Rosenwaks Yossi

Affiliation:School of Electrical Engineering
Tel:  (972)-3-6406248
Fax: (972)-3-6423508
Personal Website:

Postal Address:School of Electrical Engineering
Tel Aviv University
Tel Aviv 69978

Research Interest

Nano probing, Electrical Measurements Using Scanning Probe Microscopy
Prof. Rosenwaks is heading a research group of 10 graduate students and scientists and his current research interests include: nanoscale electrical measurements using mainly Kelvin probe force microscopy, nanowires and nanowire devices, organic and molecular transistors, charge carrier dynamics and transport in semiconductors, image restoration in Kelvin probe microscopy, novel photovoltaic devices based on inorganic and organic materials. The laboratory includes 5 KPFM systems operating in air, controlled humidity, and ultra-high vacuum environments. 

Selected Publications

  • E. Koren, N. Berkovich, and Y. Rosenwaks, "Measuring the active dopant distribution and diffusion constant in Silicon nanowires", Nanoletters, 10, 1163-1167, (2010).
  • L. Sepunaru, I. Tsimberov, L. Forolov, C. Carmeli , I. Carmeli, and Y. Rosenwaks, " Picosecond Electron Transfer From Photosysnthetic Reaction Center Protein to GaAs ", Nanoletters, 9, 2751-5, (2009).
  • O. Tal, N. Tessler, C. K. Chan, A. Kahn, and Y. Rosenwaks, "Direct determination of the hole density of states in undoped and doped amorphous organic films with high lateral resolution", Phys. Rev. Lett., 95 256405-8, (2005).
  • M. Molotskii, P. Urenski, A. Agronin, M. Shvebelman, G. Rosenman, and Y. Rosenwaks "Ferroelectric Domain breakdown", Phys. Rev. Lett., 90, 107601-4, (2003).